1. Test generation of crosstalk delay faults in VLSI circuits /

پدیدآورنده :

کتابخانه: مرکز و کتابخانه مطالعات اسلامی به زبان‌های اروپایی (قم)

موضوع : Crosstalk.,Integrated circuits-- Very large scale integration-- Testing.,Circuits and Systems.,Control Structures and Microprogramming.,Logic Design.,Performance and Reliability.,Algorithms & data structures.,Circuits & components.,Computer architecture & logic design.,Crosstalk.,Integrated circuits-- Very large scale integration-- Testing.,Systems analysis & design.,TECHNOLOGY & ENGINEERING / Mechanical

رده :
TK7874
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